On-Line Testing for VLSI / Edition 1

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Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

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Editorial Reviews

Electronic systems that can apply test functions for dynamic environmental effects such as electric noise, weather related conditions, and aging of components concurrently while continuing intended function are defined as capable of on-line testing. The information in these 15 contributions is largely derived from recent IEEE International On-Line Testing Workshops and covers such aspects as: self checking design, both complete systems and logic design techniques; thermal monitoring; methods of monitoring radiation that induces parametric faults through ionization; a mixed-mode self test that mixes random and deterministic tests; a self test scheme for data retention faults in memories; and two fault-tolerant systems stressing reconfiguration and component serviceability. Reprinted from , v.12, nos.1-2, February/April 1998. Annotation c. by Book News, Inc., Portland, Or.
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Product Details

  • ISBN-13: 9780792381327
  • Publisher: Springer US
  • Publication date: 4/30/1998
  • Series: Frontiers in Electronic Testing Series, #11
  • Edition description: Reprinted from THE JOURNAL OF ELECTRONIC TESTING, 12:1-2, 1998
  • Edition number: 1
  • Pages: 160
  • Product dimensions: 10.00 (w) x 7.00 (h) x 0.44 (d)

Table of Contents

Foreword 5
On-Line Testing for VLSI - A Compendium of Approaches 7
On-Line Fault Monitoring 21
Efficient Totally Self-Checking Shifter Design 29
A New Design Method for Self-Checking Unidirectional Combinational Circuits 41
Concurrent Delay Testing in Totally Self-Checking Systems 55
Design of Self-Testing Checkers for m-out-of-n Codes Using Parallel Counters 63
Self-Testing Embedded Two-Rail Checkers 69
Thermal Monitoring of Self-Checking Systems 81
Integrated Temperature Sensors for On-Line Thermal Monitoring of Microelectronics Structures 93
Clocked Dosimeter Compatible with Digital CMOS Technology 101
Scalable Test Generators for High-Speed Datapath Circuits 111
Mixed-Mode BIST Using Embedded Processors 127
A BIST Scheme for Non-Volatile Memories 139
On-Line Fault Resilience Through Gracefully Degradable ASICs 145
Delivering Dependable Telecommunication Services Using Off-the-Shelf System Components 153
Index 161
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