Particles and Waves in Electron Optics and Microscopy
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates all the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
1132569489
Particles and Waves in Electron Optics and Microscopy
Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates all the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing
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Particles and Waves in Electron Optics and Microscopy

Particles and Waves in Electron Optics and Microscopy

by Peter W. Hawkes (Editor)
Particles and Waves in Electron Optics and Microscopy

Particles and Waves in Electron Optics and Microscopy

by Peter W. Hawkes (Editor)

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Overview

Advances in Imaging and Electron Physics merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains. - Contains contributions from leading authorities on the subject matter - Informs and updates all the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electron, and ion emission with a valuable resource - Features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, and digital image processing

Product Details

ISBN-13: 9780128052303
Publisher: Elsevier Science & Technology Books
Publication date: 05/27/2016
Series: Advances in Imaging and Electron Physics , #194
Sold by: Barnes & Noble
Format: eBook
Pages: 358
File size: 17 MB
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About the Author

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Table of Contents

1. Complements of Geometrical Light Optics 2. Complements of Wave Optics 3. Particle Theory of Image Formation 4. Electromagnetic Lenses 5. Electron, Particles, or Waves? 6. The Wavefunction of the Paraxial Electrons 7. Fourier Optics 8. Other Interference Experiments 9. Interpretation of the Experimental Results 10. Off-Axis Electron Holography: A Short Introduction 11. Waveoptical Analysis of the Spherical Aberration 12. Epilogue

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This latest volume in the series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy, and features cutting-edge articles on recent developments in all areas of microscopy, digital image processing, and many related subjects in electron physics

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