Quantitative Atomic-Resolution Electron Microscopy

by Martin Hÿtch (Editor), Peter W. Hawkes (Editor)

Overview

Quantitative Atomic-Resolution Electron Microscopy, Volume 217, the latest release in the Advances in Imaging and Electron Physics series merges two long-running serials, Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy. The series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science, digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods. Chapters in this release include Statistical parameter estimation theory, Efficient fitting algorithm, Statistics-based atom counting , Atom column detection, Optimal experiment design for nanoparticle atom-counting from ADF STEM images, and more. - Contains contributions from leading authorities on the subject matter - Informs and updates on the latest developments in the field of imaging and electron physics - Provides practitioners interested in microscopy, optics, image processing, mathematical morphology, electromagnetic fields, electrons and ion emission with a valuable resource

Product Details

ISBN-13:	9780323850933
Publisher:	Elsevier Science & Technology Books
Publication date:	03/31/2021
Series:	Advances in Imaging and Electron Physics , #217
Sold by:	Barnes & Noble
Format:	eBook
Pages:	294
File size:	15 MB
Note:	This product may take a few minutes to download.

About the Author

Dr Martin Hÿtch, serial editor for the book series “Advances in Imaging and Electron Physics (AIEP)”, is a senior scientist at the French National Centre for Research (CNRS) in Toulouse. He moved to France after receiving his PhD from the University of Cambridge in 1991 on “Quantitative high-resolution transmission electron microscopy (HRTEM)”, joining the CNRS in Paris as permanent staff member in 1995. His research focuses on the development of quantitative electron microscopy techniques for materials science applications. He is notably the inventor of Geometric Phase Analysis (GPA) and Dark-Field Electron Holography (DFEH), two techniques for the measurement of strain at the nanoscale. Since moving to the CEMES-CNRS in Toulouse in 2004, he has been working on aberration-corrected HRTEM and electron holography for the study of electronic devices, nanocrystals and ferroelectrics. He was laureate of the prestigious European Microscopy Award for Physical Sciences of the European Microscopy Society in 2008. To date he has published 130 papers in international journals, filed 6 patents and has given over 70 invited talks at international conferences and workshops.
Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Table of Contents

1. IntroductionSandra Van Aert2. Statistical parameter estimation theorySandra Van Aert3. Efficient fitting algorithm Sandra Van Aert4. Statistics-based atom counting Sandra Van Aert5. Atom column detection Sandra Van Aert6. Optimal experiment design for nanoparticle atom-counting from ADF STEM imagesSandra Van Aert7. Maximum a posteriori probability Sandra Van Aert8. Discussion and conclusionsSandra Van Aert9. Phase retrieval methods applied to coherent imagingTatiana Latychevskaia

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From the Publisher

Presents cutting-edge articles on the latest developments in all areas of microscopy, image science and related subjects in electron physics