Quantitative X-Ray Spectrometry

by Ron Jenkins

Overview

This work covers important aspects of X-ray spectrometry, from basic principles to the selection of instrument parameters and sample preparation. This edition explicates the use of combined X-ray fluorescence and X-ray diffraction data, and features new applications in environmental studies, forensic science, archeometry and the analysis of metals

Product Details

ISBN-13:	9781040219447
Publisher:	CRC Press
Publication date:	04/26/1995
Series:	Practical Spectroscopy
Sold by:	Barnes & Noble
Format:	eBook
Pages:	504
File size:	21 MB
Note:	This product may take a few minutes to download.

Table of Contents

The interaction of X-rays with matter; sources for the excitation of characteristic X-rays; instrumentation; statistics; general computer applications and quantitative spectrum analysis as applied to energy-dispersive analysis; specimen preparation; qualitative analysis; basic problems in quantitative analysis; methods and models for quantitative analysis; trace analysis; radiation health hazards in X-ray spectrometry; applications of X-ray spectrometry. Appendices: no-menclature; mass absorption coefficients; conversions and physical constants; atomic weights and densities; wavelengths and energies; wavelength tables for K, L, and M series.

Editorial Reviews

Ron Jenkins could...be described as the doyen of XRF and together with his colleagues R. W. Gould and Dale Gedcke brings vast wealth of experience to the subject of XRF.... "...the main revisions to this second edition are the inclusion of details of layered synthetic microstructures, total reflection X-ray spectrometry, and the influence of the personal computer....an important contribution to XRF and will be of interest to both new and established workers in this field.

Journal of Analytical Atomic Spectrometry

...a valuable compendium for the practicing x-ray spectroscopist in industry and science or researchers in other fields who have to apply x-ray analysis.

Journal of Applied Crystallography

International praise for the previous edition... "...critically describes x-ray instrumentation and techniques...has one of the most extensive discussions of energy-dispersive x-ray spectrometry of any book.

Analytical Chemistry

A substantially revised reference covering virtually every important aspect of x-ray spectrometry from basic principles to the selection of instrument parameters and sample preparation. Chapters cover the interaction of x-rays with matter; sources for the excitation of characteristic x-rays; instrumentation; statistics; general computer applications and quantitative spectrum analysis as applied to energy-dispersive analysis; specimen preparation; qualitative analysis; basic problems in quantitative analysis; methods and models for quantitative analysis; trace analysis; radiation health hazards in x-ray spectrometry; and applications of x-ray spectrometry. Numerous appendices clarify nomenclature and provide relevant lists and tables. Annotation c. Book News, Inc., Portland, OR (booknews.com)

Booknews

"International praise for the previous edition. . . . . .critically describes x-ray instrumentation and techniques. . .has one of the most extensive discussions of energy-dispersive x-ray spectrometry of any book. "
—-Analytical Chemistry
". . .a valuable compendium for the practicing x-ray spectroscopist in industry and science or researchers in other fields who have to apply x-ray analysis. "
—-Journal of Applied Crystallography
"Ron Jenkins could. . .be described as the doyen of XRF and together with his colleagues R. W. Gould and Dale Gedcke brings vast wealth of experience to the subject of XRF. . .. . . .the main revisions to this second edition are the inclusion of details of layered synthetic microstructures, total reflection X-ray spectrometry, and the influence of the personal computer. . ..an important contribution to XRF and will be of interest to both new and established workers in this field. "
—-Journal of Analytical Atomic Spectrometry

From the Publisher