Radiation Effects And Soft Errors In Integrated Circuits And Electronic Devices

by Ronald D Schrimpf, Daniel M Fleetwood

Overview

This book provides a detailed treatment of radiation effects in electronic devices, including effects at the material, device, and circuit levels. The emphasis is on transient effects caused by single ionizing particles (single-event effects and soft errors) and effects produced by the cumulative energy deposited by the radiation (total ionizing dose effects). Bipolar (Si and SiGe), metal-oxide-semiconductor (MOS), and compound semiconductor technologies are discussed. In addition to considering the specific issues associated with high-performance devices and technologies, the book includes the background material necessary for understanding radiation effects at a more general level.

Product Details

ISBN-13:	9789812389404
Publisher:	World Scientific Publishing Company, Incorporated
Publication date:	08/03/2004
Series:	Selected Topics In Electronics And Systems , #34
Edition description:	New Edition
Pages:	348
Product dimensions:	6.70(w) x 9.80(h) x 1.00(d)