Robust Computing with Nano-scale Devices: Progresses and Challenges
Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.

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Robust Computing with Nano-scale Devices: Progresses and Challenges
Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.

109.99 In Stock
Robust Computing with Nano-scale Devices: Progresses and Challenges

Robust Computing with Nano-scale Devices: Progresses and Challenges

Robust Computing with Nano-scale Devices: Progresses and Challenges

Robust Computing with Nano-scale Devices: Progresses and Challenges

Hardcover(2010)

$109.99 
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Overview

Robust Nano-Computing focuses on various issues of robust nano-computing, defect-tolerance design for nano-technology at different design abstraction levels. It addresses both redundancy- and configuration-based methods as well as fault detecting techniques through the development of accurate computation models and tools. The contents present an insightful view of the ongoing researches on nano-electronic devices, circuits, architectures, and design methods, as well as provide promising directions for future research.


Product Details

ISBN-13: 9789048185399
Publisher: Springer Netherlands
Publication date: 03/26/2010
Series: Lecture Notes in Electrical Engineering , #58
Edition description: 2010
Pages: 180
Product dimensions: 6.40(w) x 9.30(h) x 0.70(d)

Table of Contents

Fault Tolerant Nanocomputing.- Transistor-Level Based Defect-Tolerance for Reliable Nanoelectronics.- Fault-Tolerant Design for Nanowire-Based Programmable Logic Arrays.- Built-In Self-Test and Defect Tolerance for Molecular Electronics-Based NanoFabrics.- The Prospect and Challenges of CNFET Based Circuits: A Physical Insight.- Computing with Nanowires: A Self Assembled Neuromorphic Architecture.- Computational Opportunities and CAD for Nanotechnologies.
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