Runs and Scans with Applications / Edition 1

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Overview

This book presents both the theoretical as well as the applied aspects of runs and patterns, and illustrates through various applications from science and engineering their important role in the field of reliability analysis. This hot topic addresses both classical problems (such as sooner and later waiting time) and current problems (such as consecutive systems, start-up demonstration testing in life-testing experiments, learning and memory models, and "match" in genetic codes).
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Editorial Reviews

From the Publisher
“…many excellent features…” (Statistical Methods in Medical Research, No.13, 2004)

"...provides excellent coverage of the topic of scans, and runs, including a nice historical account and guide to the literature..." (Technometrics, Vol. 44, No. 4, November 2002)

"...highly recommended…well done and perfectly edited..." (Journal of the American Statistical Association, December 2002)

"...a great resource..." (International Journal of General Systems, Vol. 32, 2003)

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Product Details

Meet the Author

N. BALAKRISHNAN, PhD, is Professor of Mathematics and Statistics at McMaster University in Hamilton, Ontario, Canada. He is also the author of A First Course in Order Statistics and four volumes of the Distributions in Statistics series (all from Wiley).

MARKOS V. KOUTRAS, PhD, is Professor of Statistics at the University of Piraeus in Greece, where he researches applied probability, reliability, and distribution theory.

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Table of Contents

List of Tables
List of Figures
Preface
1 Introduction and Historical Remarks 1
2 Waiting for the First Run Occurrence 9
3 Applications 71
4 Waiting for Multiple Run Occurrences 101
5 Number of Run Occurrences 139
6 Sooner/Later Run Occurrences 195
7 Multivariate Run-Related Distributions 243
8 Applications 271
9 Waiting for the First Scan 291
10 Waiting for Multiple Scans 325
11 Number of Scan Occurrences 357
12 Applications 377
Bibliography 389
Author Index 437
Subject Index 445
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