Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists / Edition 2

Scanning Electron Microscopy and X-Ray Microanalysis: A Text for Biologists, Materials Scientists, and Geologists / Edition 2

by Joseph Goldstein, Dale E. Newbury, Patrick Echlin, David C. Joy
     
 

ISBN-10: 0306441756

ISBN-13: 9780306441752

Pub. Date: 05/28/1992

Publisher: Springer US

Product Details

ISBN-13:
9780306441752
Publisher:
Springer US
Publication date:
05/28/1992
Edition description:
2nd ed.
Pages:
820
Product dimensions:
(w) x (h) x 0.08(d)

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