×

Uh-oh, it looks like your Internet Explorer is out of date.

For a better shopping experience, please upgrade now.

Sensitivity of two beam transmission electron microscope images to the structure of small crystal defects
     

Sensitivity of two beam transmission electron microscope images to the structure of small crystal defects

by Lawrence Joseph Sykes
 

Product Details

BN ID:
2940022806212
Sold by:
Barnes & Noble
Format:
NOOK Book
File size:
252 KB

Customer Reviews

Average Review:

Post to your social network

     

Most Helpful Customer Reviews

See all customer reviews