Statistical Methods for SPC and TQM
Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices.
Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered.

Contents
Data Collection and Graphical Summaries
Numerical Data Summaries-Location and Dispersion
Probability and Distribution
Sampling, Estimation, and Confidence
Sample Tests of Hypothesis; "Significance Tests"
Control Charts for Process Management and Improvement
Control Charts for Average and Variation
Control Charts for "Single-Valued" Observations
Control Charts for Attributes and Events
Control Charts: Problems and Special Cases
Cusum Methods
Process Capability-Attributes, Events, and Normally Distributed Data
Capability; Non-Normal Distributions
Evaluating the Precision of a Measurement System (Gauge Capability)
Getting More from Control Chart Data
SPC in "Non-Product" Applications
Appendices
1128432046
Statistical Methods for SPC and TQM
Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices.
Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered.

Contents
Data Collection and Graphical Summaries
Numerical Data Summaries-Location and Dispersion
Probability and Distribution
Sampling, Estimation, and Confidence
Sample Tests of Hypothesis; "Significance Tests"
Control Charts for Process Management and Improvement
Control Charts for Average and Variation
Control Charts for "Single-Valued" Observations
Control Charts for Attributes and Events
Control Charts: Problems and Special Cases
Cusum Methods
Process Capability-Attributes, Events, and Normally Distributed Data
Capability; Non-Normal Distributions
Evaluating the Precision of a Measurement System (Gauge Capability)
Getting More from Control Chart Data
SPC in "Non-Product" Applications
Appendices
240.0 In Stock
Statistical Methods for SPC and TQM

Statistical Methods for SPC and TQM

by D Bissell
Statistical Methods for SPC and TQM

Statistical Methods for SPC and TQM

by D Bissell

Hardcover(1st ed)

$240.00 
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Overview

Statistical Methods for SPC and TQM sets out to fill the gap for those in statistical process control (SPC) and total quality management (TQM) who need a practical guide to the logical basis of data presentation, control charting, and capability indices.
Statistical theory is introduced in a practical context, usually by way of numerical examples. Several methods familiar to statisticians have been simplified to make them more accessible. Suitable tabulations of these functions are included; in several cases, effective and simple approximations are offered.

Contents
Data Collection and Graphical Summaries
Numerical Data Summaries-Location and Dispersion
Probability and Distribution
Sampling, Estimation, and Confidence
Sample Tests of Hypothesis; "Significance Tests"
Control Charts for Process Management and Improvement
Control Charts for Average and Variation
Control Charts for "Single-Valued" Observations
Control Charts for Attributes and Events
Control Charts: Problems and Special Cases
Cusum Methods
Process Capability-Attributes, Events, and Normally Distributed Data
Capability; Non-Normal Distributions
Evaluating the Precision of a Measurement System (Gauge Capability)
Getting More from Control Chart Data
SPC in "Non-Product" Applications
Appendices

Product Details

ISBN-13: 9780412394409
Publisher: Taylor & Francis
Publication date: 05/15/1994
Series: Chapman & Hall/CRC Texts in Statistical Science , #26
Edition description: 1st ed
Pages: 384
Product dimensions: 8.25(w) x 11.00(h) x (d)
Age Range: 18 Years

About the Author

D Bissell
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