Advances in Imaging and Electron Physics: Theory of Intense Beams of Charged Particles

by Peter W. Hawkes

Overview

Advances in Imaging and Electron Physics merges two long-running serials—Advances in Electronics and Electron Physics and Advances in Optical and Electron Microscopy.

This series features extended articles on the physics of electron devices (especially semiconductor devices), particle optics at high and low energies, microlithography, image science and digital image processing, electromagnetic wave propagation, electron microscopy, and the computing methods used in all these domains.

Product Details

ISBN-13:	9780123813107
Publisher:	Elsevier Science
Publication date:	06/21/2011
Series:	Advances in Imaging and Electron Physics , #166
Pages:	752
Product dimensions:	6.30(w) x 9.10(h) x 1.70(d)

About the Author

Peter Hawkes obtained his M.A. and Ph.D (and later, Sc.D.) from the University of Cambridge, where he subsequently held Fellowships of Peterhouse and of Churchill College. From 1959 – 1975, he worked in the electron microscope section of the Cavendish Laboratory in Cambridge, after which he joined the CNRS Laboratory of Electron Optics in Toulouse, of which he was Director in 1987. He was Founder-President of the European Microscopy Society and is a Fellow of the Microscopy and Optical Societies of America. He is a member of the editorial boards of several microscopy journals and serial editor of Advances in Electron Optics.

Table of Contents

1. Beam equations
2. Exact solutions to the beam equations
3. Anti-paraxial expansions
4. Solution of the beam formation problem in 3D case
5. Asymptotic theory of 3D flows
6. Geometrized theory
7. Examples of applications