Topics in Electron Diffraction and Microscopy of Materials

Overview

Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work.

The book provides a useful overview of current...

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Overview

Topics in Electron Diffraction and Microscopy of Materials celebrates the retirement of Professor Michael Whelan from the University of Oxford. Professor Whelan taught many of today's heads of department and was a pioneer in the development and use of electron microscopy. His collaborators and colleagues, each one of whom has made important advances in the use of microscopy to study materials, have contributed to this cohesive work.

The book provides a useful overview of current applications for selected electron microscope techniques that have become important and widespread in their use for furthering our understanding of how materials behave. Linked through the dynamical theory of electron diffraction and inelastic scattering, the topics discussed include the history and impact of electron microscopy in materials science, weak-beam techniques for problem solving, defect structures and dislocation interactions, using beam diffraction patterns to look at defects in structures, obtaining chemical identification at atomic resolution, theoretical developments in backscattering channeling patterns, new ways to look at atomic bonds, using numerical simulations to look at electronic structure of crystals, RHEED observations for MBE growth, and atomic level imaging applications.

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Editorial Reviews

Booknews
Each of nine chapters reviews the development and application of a particular electron microscope technique used to interrogate the structure of materials, and examines its application to problems in materials science. Overall, the volume demonstrates the connection between the transmission, backscattering and reflection aspects of the propagation of electrons. Among the topics are atomic resolution imaging using high energy and low energy electrons which exploits their different physical mechanisms, and the historical development of diffraction contrast imaging of defects in crystals. The articles were first presented at a September 1997 symposium held in Oxford. Intended for researchers in materials science, metallurgy, and physics. Annotation c. Book News, Inc., Portland, OR booknews.com
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Product Details

Table of Contents

Introduction
P.B. Hirsch

Early days of diffraction contrast transmission electron microscopy
P.B. Hirsch

Applications of weak-beam technique of electron microscopy
D.J.H. Cockayne

2-beam and n-beam diffraction
A.F. Moodie

Pseudo aberration-free-focusing imaging method for atomic resolution electron microscopy of crystals
H. Hashimoto

Probing atomic bonding using fast electrons
C.J. Humphreys and G.A. Botton

Interpretation of spatially resolved valence loss spectra
A. Howie

Is molecular imaging possible?
J.C.H. Spence et al.

Diffraction imaging using backscattered electrons: fundamentals and applications
S.L. Dudarev

Development of dynamical theory of RHEED and applications to the in situ monitoring of MBE growth
L.-M. Peng

Index

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