Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry
518Transmission Electron Microscopy: Diffraction, Imaging, and Spectrometry
518Hardcover(1st ed. 2016)
Related collections and offers
Product Details
ISBN-13: | 9783319266497 |
---|---|
Publisher: | Springer International Publishing |
Publication date: | 08/25/2016 |
Edition description: | 1st ed. 2016 |
Pages: | 518 |
Product dimensions: | 8.27(w) x 10.98(h) x (d) |