Transmission Electron Microscopy: A Textbook for Materials Science / Edition 1by David Brian Williams, C. Barry Carter
Pub. Date: 01/28/1996
Publisher: Springer-Verlag New York, LLC
This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable… See more details below
This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.
- Springer-Verlag New York, LLC
- Publication date:
- Product dimensions:
- 8.80(w) x 11.26(h) x 1.58(d)
Table of ContentsBasics.- The Transmission Electron Microscope.- Scattering and Diffraction.- Elastic Scattering.- Inelastic Scattering and Beam Damage.- Electron Sources.- Lenses, Apertures, and Resolution.- How to ‘See’ Electrons.- Pumps and Holders.- The Instrument.- Specimen Preparation.- Diffraction.- Diffraction in TEM.- Thinking in Reciprocal Space.- Diffracted Beams.- Bloch Waves.- Dispersion Surfaces.- Diffraction from Crystals.- Diffraction from Small Volumes.- Obtaining and Indexing Parallel-Beam Diffraction Patterns.- Kikuchi Diffraction.- Obtaining CBED Patterns.- Using Convergent-Beam Techniques.- Imaging.- Amplitude Contrast.- Phase-Contrast Images.- Thickness and Bending Effects.- Planar Defects.- Imaging Strain Fields.- Weak-Beam Dark-Field Microscopy.- High-Resolution TEM.- Other Imaging Techniques.- Image Simulation.- Processing and Quantifying Images.- Spectrometry.- X-ray Spectrometry.- X-ray Spectra and Images.- Qualitative X-ray Analysis and Imaging.- Quantitative X-ray Analysis.- Spatial Resolution and Minimum Detection.- Electron Energy-Loss Spectrometers and Filters.- Low-Loss and No-Loss Spectra and Images.- High Energy-Loss Spectra and Images.- Fine Structure and Finer Details.
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Williams and Carter has always been among the best introductory books for the field of transmission electron microscopy. With this revised edition, the authors have completely updated the text, including beautiful full color graphics and the latest advancements in microscopy. The text is divided into four parts: an introduction to the microscope itself, a study of diffraction theory, a guide to imaging, and a section on advanced spectroscopic techniques. This text isn't for the faint of heart--it's long and exhaustive, but completely readable throughout. The authors break down complex concepts in easy to understand language and make only basic assumptions about the reader's physics and materials science background. I highly recommend this book to anyone looking for a thorough and authoritative guide to all topics relating to transmission electron microscopy. The new graphics and additions sweeten the deal even more.