Transmission Electron Microscopy: A Textbook for Materials Science / Edition 2

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Overview

This profusely illustrated text on Transmission Electron Microscopy provides the necessary instructions for successful hands-on application of this versatile materials characterization technique. The new edition also includes an extensive collection of questions for the student, providing approximately 800 self-assessment questions and over 400 questions suitable for homework assignment.

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Editorial Reviews

From the Publisher
From the reviews of the second edition:

“This book is intended to be used as a textbook for material science students studying the theory, operation, and application of the TEM. It is truly a book so thoughtfully written that … it will provide a solid foundation for those studying material science. It is richly illustrated with full-color figures and illustrations throughout the text. … There are an abundant number of references at the end of each chapter for further study … . This is an outstanding book … .” (IEEE Electrical Insulation Magazine, Vol. 26 (4), July/August, 2010)

“D.B. Williams and C.B. Carter have now prepared a new edition, splendidly produced by Springer with colour throughout. … This textbook is magnificent, written in a very readable style, immensely knowledgeable, drawing attention to difficulties and occasionally to unsolved problems. Any microscopist who has mastered … the book relevant to his projects will be well armed for battle. … Buy this book!” (P. W. Hawkes, Ultramicroscopy, Vol. 110, 2010)

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Product Details

  • ISBN-13: 9780387765020
  • Publisher: Springer US
  • Publication date: 8/5/2009
  • Edition description: 2nd ed. 2009
  • Edition number: 2
  • Pages: 760
  • Sales rank: 914,796
  • Product dimensions: 8.30 (w) x 11.10 (h) x 1.80 (d)

Table of Contents

Basics.- The Transmission Electron Microscope.- Scattering and Diffraction.- Elastic Scattering.- Inelastic Scattering and Beam Damage.- Electron Sources.- Lenses, Apertures, and Resolution.- How to ‘See’ Electrons.- Pumps and Holders.- The Instrument.- Specimen Preparation.- Diffraction.- Diffraction in TEM.- Thinking in Reciprocal Space.- Diffracted Beams.- Bloch Waves.- Dispersion Surfaces.- Diffraction from Crystals.- Diffraction from Small Volumes.- Obtaining and Indexing Parallel-Beam Diffraction Patterns.- Kikuchi Diffraction.- Obtaining CBED Patterns.- Using Convergent-Beam Techniques.- Imaging.- Amplitude Contrast.- Phase-Contrast Images.- Thickness and Bending Effects.- Planar Defects.- Imaging Strain Fields.- Weak-Beam Dark-Field Microscopy.- High-Resolution TEM.- Other Imaging Techniques.- Image Simulation.- Processing and Quantifying Images.- Spectrometry.- X-ray Spectrometry.- X-ray Spectra and Images.- Qualitative X-ray Analysis and Imaging.- Quantitative X-ray Analysis.- Spatial Resolution and Minimum Detection.- Electron Energy-Loss Spectrometers and Filters.- Low-Loss and No-Loss Spectra and Images.- High Energy-Loss Spectra and Images.- Fine Structure and Finer Details.

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Sort by: Showing 1 Customer Reviews
  • Posted September 5, 2009

    Thorough, authoritative, and greatly expanded

    Williams and Carter has always been among the best introductory books for the field of transmission electron microscopy. With this revised edition, the authors have completely updated the text, including beautiful full color graphics and the latest advancements in microscopy.

    The text is divided into four parts: an introduction to the microscope itself, a study of diffraction theory, a guide to imaging, and a section on advanced spectroscopic techniques. This text isn't for the faint of heart--it's long and exhaustive, but completely readable throughout. The authors break down complex concepts in easy to understand language and make only basic assumptions about the reader's physics and materials science background.

    I highly recommend this book to anyone looking for a thorough and authoritative guide to all topics relating to transmission electron microscopy. The new graphics and additions sweeten the deal even more.

    1 out of 1 people found this review helpful.

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