Two-dimensional X-ray Diffraction / Edition 1

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Two-Dimensional X-Ray Diffraction shows how two-dimensional X-ray diffraction can be a useful tool for the examination of metals, polymers, semiconductors, thin films, coatings, paints, biomaterials and composites for material science researches, molecular structure determination and polymorphism study for drug discovery and processing, and samples with micro volume or micro-area for forensic analysis, and archaeology analysis, to name just a few of the method's applications. Researchers in materials science, chemistry, physics, pharmaceuticals, and related fields will find this introductory reference invaluable in understanding and applying two-dimensional X-ray diffraction for examining a broad range of samples.

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Editorial Reviews

From the Publisher
"The author has maintained a very readable style for the whole of this intensely practical and useful book. It should become a standard text for the development of new laboratory systems or for students trying to interpret data from 2D area detector systems of any type. It will also be of use to anyone setting up a 2D system regardless of geometry, since the underlying principles of the scattering process and the projection of that scattering are so lucidly presented." (Crystallography Reviews, March 2011)

"Written by one of the pioneers of the field … .For researchers and graduate students in materials science, chemistry, physics, and pharmaceuticals." (Book News, December 2009)

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Product Details

  • ISBN-13: 9780470227220
  • Publisher: Wiley
  • Publication date: 8/10/2009
  • Edition description: New Edition
  • Edition number: 1
  • Pages: 426
  • Product dimensions: 6.30 (w) x 9.30 (h) x 1.00 (d)

Meet the Author

Bob Baoping He is the Director of R&D and Engineering at Bruker AXS (formerly Siemens AXS). Mr. He holds a PhD in materials science from Virginia Tech and holds twelve U.S. patents.
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Table of Contents

1 Introduction 1

2 Geometry Conventions 28

3 X-Ray Source and Optics 51

4 X-Ray Detectors 85

5 Goniometer and Sample Stages 133

6 Data Treatment 151

7 Phase Identification 191

8 Texture Analysis 218

9 Stress Measurement 249

10 Small-Angle X-Ray Scattering 329

11 Combinatorial Screening 351

12 Quantitative Analysis 369

13 Innovation and Future Development 393

Appendix A Values of Commonly Used Parameters 407

Appendix B Symbols 412

Index 419

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Customer Reviews

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  • Anonymous

    Posted October 28, 2012


    "Sure!" She walked there

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    Posted October 27, 2012



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