X-Ray Scattering from Soft-Matter Thin Films: Materials Science and Basic Research

by Metin Tolan

Overview

The properties of soft-matter thin films (e.g. liquid films, polymer coatings, Langmuir-Blodgett multilayers) nowadays play an important role in materials science. They are also very exciting with respect to fundamental questions: In thin films, liquids and polymers may be considered as trapped in a quasi-two-dimensional geometry. This confined geometry is expected to alter the properties and structures of these materials considerably. This volume is dedicated to the scattering of x-rays by soft-matter interfaces. X-ray scattering under grazing angles is the only tool to investigating these materials on atomic and mesoscopic length scales. A review of the field is presented with many examples.

Product Details

ISBN-13:	9783662142189
Publisher:	Springer Berlin Heidelberg
Publication date:	03/26/2013
Series:	Springer Tracts in Modern Physics , #148
Edition description:	Softcover reprint of the original 1st ed. 1999
Pages:	198
Product dimensions:	6.10(w) x 9.25(h) x 0.02(d)

Table of Contents

Reflectivity of x-rays from surfaces.- Reflectivity experiments.- Advanced analysis techniques.- Statistical description of interfaces.- Off-specular scattering.- X-ray scattering with coherent radiation.- Closing remarks.

Editorial Reviews

"The book is well referenced and clearly conveys materials systems and behavior that are amenable to characterization by thin-film scattering techniques. It should be an asset to any research group beginning, or currently involved in, the characterization of thin films by x-ray diffraction."

Physics Today, 2000/2

From the Publisher