X-Ray Spectrometry in Electron Beam Instruments

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This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis.

Problems & trends in X-ray detector design for microanalysis/germanium X-ray detectors.

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Editorial Reviews

From the Publisher
'[A] rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension.'
from the Foreword by Peter Duncumb, University of Cambridge, England
'Contains a vast amount of detailed information and will surely be heavily used.'
A collection of papers derived from a special symposium held at the Microbeam Analysis Society Meeting of 1993 in Los Angeles, providing an overall view of current research in the field of x-ray spectrometry as it relates to the practice of electron probe x-ray microanalysis. Among the topics are the development of energy dispersive electron probe analysis; problems and trends in x-ray detector design for microanalysis; germanium x-ray detectors; modeling the energy dispersive x-ray detector; improving EDS performance with digital pulse processing; a review of wavelength dispersive spectrometry; and an evaluation of quantitative electron probe methods. Annotation c. Book News, Inc., Portland, OR (booknews.com)
From the Publisher
'[A] rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension.'
from the Foreword by Peter Duncumb, University of Cambridge, England
'Contains a vast amount of detailed information and will surely be heavily used.'
Read More Show Less

Product Details

  • ISBN-13: 9780306448584
  • Publisher: Springer-Verlag New York, LLC
  • Publication date: 5/20/1997
  • Edition description: New Edition
  • Pages: 396
  • Product dimensions: 0.88 (w) x 7.00 (h) x 10.00 (d)

Table of Contents

The Development of Energy Dispersive Electron Probe Analysis; K.F.J. Heinrich. Problems and Trends in X-ray Detector Design for Microanalysis; B.G. Lowe. New Materials for Thin Windows; M.W. Lund. Intrinsic Ge Detectors; R. Sareen. Modeling the Energy-dispersive X-ray Detector; D.C. Joy. The Effect of Detector Dead Layers on Light Element Detection; J.J. McCarthy. Energy-dispersive X-ray Spectrometry in Ultra-high Vacuum Environments; J.R. Michael. Quantifying Benefits of Resolution and Count Rate in EDX Microanalysis; P.J. Statham. Improving EDS Performance with Digital Pulse Processing; R.B. Mott, J.J. Friel. A Study of Systematic Errors in Multiple Linear Regression Peak Fitting Using Generated Spectra; C.R. Swyt. Artifacts in Energy-dispersive X-ray Spectrometry in Electron Beam Instruments: Are Things Getting Any Better?; D.E. Newbury. Characterizing an Energy-dispersive Spectrometer on an Analytical Electron Microscope; S.M. Zemyan, D.B. Williams. Wavelength Dispersive Spectrometry - A Review; S.J.B. Reed. Synthetic Multilayer Crystals for EPMA of Ultralight Elements; G.F. Bastin, H.J.M. Heijligers. 4 additional articles. Index.

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