X-Ray Spectrometry in Electron Beam Instruments

X-Ray Spectrometry in Electron Beam Instruments

by Joseph Goldstein
     
 

This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis.

Overview

This volume reviews current research in the field of X-ray spectrometry and its relationship to the practice of electron probe X-ray microanalysis.

Editorial Reviews

From the Publisher
'[A] rich and authoritative collection of papers, which have both a historical and an up-to-the-minute dimension.'
from the Foreword by Peter Duncumb, University of Cambridge, England
'Contains a vast amount of detailed information and will surely be heavily used.'
Ultramicroscopy
Booknews
A collection of papers derived from a special symposium held at the Microbeam Analysis Society Meeting of 1993 in Los Angeles, providing an overall view of current research in the field of x-ray spectrometry as it relates to the practice of electron probe x-ray microanalysis. Among the topics are the development of energy dispersive electron probe analysis; problems and trends in x-ray detector design for microanalysis; germanium x-ray detectors; modeling the energy dispersive x-ray detector; improving EDS performance with digital pulse processing; a review of wavelength dispersive spectrometry; and an evaluation of quantitative electron probe methods. Annotation c. Book News, Inc., Portland, OR (booknews.com)

Product Details

ISBN-13:
9781461357384
Publisher:
Springer US
Publication date:
12/31/2013
Edition description:
Softcover reprint of the original 1st ed. 1995
Pages:
372
Product dimensions:
7.01(w) x 10.00(h) x 0.03(d)

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