Advanced Production Testing of RF, SoC, and SiP Devices

Advanced Production Testing of RF, SoC, and SiP Devices


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Advanced Production Testing of RF, SoC, and SiP Devices by Joe Kelly, Michael Engelhardt

Featuring invaluable input from industry-leading companies and highly-regarded experts in the field, this first-of-its kind resource offers experienced engineers a comprehensive understanding of the advanced topics in RF, SiP (system-in-package), and SoC (system-on-a-chip) production testing that are critical to their work involving semiconductor devices. The book covers key measurement concepts for semiconductor device testing and assists engineers in explaining these concepts to management to aid in the reduction of project cost, time, and resources. Based on real-world experience and packed with time-saving equations, this in-depth volume offers professionals practical information on essential topics that have never been presented in a single reference before.

Product Details

ISBN-13: 9781580537094
Publisher: Artech House, Incorporated
Publication date: 01/28/2007
Series: Artech House Microwave Library
Pages: 301
Product dimensions: 6.22(w) x 9.30(h) x 0.90(d)

About the Author

Joe Kelly is a Wireless Center of Expertise senior RF technical consultant at Agilent Technologies. He is also the coauthor of Production Testing of RF and System-on-a-Chip Devices (Artech House, 2004) and a frequent presenter at international conferences and workshops. Dr. Kelly earned his Ph.D. at Rutgers University. Michael D. Engelhardt is a senior RF applications engineer at Agilent Technologies. He holds an M.S. in electrical engineering from the University of Ulm, Germany and an M.B.A. from the University of Dallas. Mr. Engelhardt has written several papers for major international conferences.

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