Symposium SS, “Advanced Imaging and Scattering Techniques for In Situ Studies,” Symposium TT, “In Situ X-Ray Synchrotron Radiation Spectroscopies in Energy-Related Materials Science and Heterogeneous Catalysis,” Symposium UU, “Real-Time Studies of Evolving Thin Films and Interfaces” and Symposium VV, “Novel Development and Applications of Scanning Probe Microscopy,” were held at the 2010 MRS Fall Meeting in Boston, Massachusetts. A major unifying theme for these symposia is exploration of intricate properties of materials on the near-to-atomic length scale in the immediate vicinity of the free surface or at interfaces between materials. These symposia focus on various aspects and approaches of exploration of surfaces and interfaces from more traditional electron and x-ray scattering (the focus of Symposia SS, TT, and UU) to more recent and rapidly advancing scanning probe microscopy, or SPM (Symposium VV). Together, they cover a field of great importance across the broad MRS community.
Table of Contents
Part I. Advanced Imaging and Scattering Techniques for In Situ Studies: 1. In situ imaging at the NIST neutron imaging facility David Jacobson; 2. Low energy Ne scattering spectroscopy for insulators, and materials in the electric/magnetic fields Kenji Umezawa; 3. Electron phase microscopy of magnetic fields in ferromagnets and superconductors Akira Tonomura; 4. Effect of oxygen pressure on the initial oxidation behavior of Cu and Cu-Au alloys Guangwen Zhou; 5. Automated crystallite orientation and phase mapping in the transmission electron microscope Peter Moeck; Part II. In Situ X-Ray Synchrotron Radiation Spectroscopies in Energy-Related Materials Science and Heterogeneous Catalysis: 6. Electronic structures of non-Pt carbon alloy catalysts for polymer electrolyte membrane fuel cells revealed by synchrotron radiation analyses Masaharu Oshima; 7. Quantum rods and dots-based structures and devices: low cost aqueous synthesis and bandgap engineering for solar hydrogen and solar cells applications Lionel Vayssieres; Part III. Real-Time Studies of Evolving Thin Films and Interfaces: 8. Formation of irregular Al islands by room-temperature deposition on NiAl(110) Jim Evans; 9. In-situ TEM observation of formation-retraction-fracture experiment of liquid-like silicon nanocontact Tadashi Ishida; 10. Observation of real-time thin film evolution using microcantilever sensors Alan Schilowitz; 11. X-ray study of strained and strain balanced superlattice materials Natee Johnson; 12. In-situ XRD and FIB microscopy studies of the dynamics of intermetallic phase formation in thin layer Cu/Sn films for low-temperature isothermal diffusion soldering Harald Etschmaier; 13. Stochastic models of epitaxial growth Dionisios Margetis; 14. Characterisation of organic semiconductor growth using real-time electron spectroscopy Andrew Evans; 15. The electrical conduction at early stages of cluster-assembled films growth Emanuele Barborini; 16. Spreading kinetics at a molecular level Jean-Luc Buraud; Part IV. Real-Time Studies of Evolving Thin Films and Interfaces: 17. Multiparameter imaging and understanding the role of the tip – atomic resolution images of rutile TiO2 (110) John Pethica; 18. Experimental and theoretical study of the new image force microscopy principle H. Kumar Wickramasinghe; 19. Crystallographic processing of scanning tunneling microscopy images of cobalt phthalocyanines on silver and graphite Peter Moeck; 20. Scanning thermal lithography as a tool for highly localized nanoscale chemical surface functionalization Joost Duvigneau; 21. Digital pulsed force mode AFM and confocal Raman microscopy in drug-eluting coatings research Greg Haugstad; 22. Measurement of piezoelectric transverse and longitudinal displacement with atomic force microscopy for PZT thick films Yuta Kashiwagi; 23. Circular AFM mode: a new AFM mode for investigating surface properties Olivier Noel; 24. Scanning probe microscopy with diamond tip in tribo-nanolithography Oleg Lysenko; 25. Photoinduced temporal change of surface-potential undulation on Alq3 thin films observed by Kelvin probe force microscopy Kazunari Ozasa; 26. Atomic force microscopy based quantitative mapping of elastic moduli in phase separated polyurethanes and silica reinforced rubbers across the length scales Peter Schoen; 27. In situ chemical functionalization of a single carbon nanotube functionalized AFM tip using a correlated optical and atomic force microscope Katherine Willets.