Advances in X-ray Analysis: Volume 20

Advances in X-ray Analysis: Volume 20

by Howard McMurdie (Editor)

Paperback(Softcover reprint of the original 1st ed. 1977)

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Product Details

ISBN-13: 9781461399834
Publisher: Springer US
Publication date: 12/12/2012
Edition description: Softcover reprint of the original 1st ed. 1977
Pages: 604
Product dimensions: 7.01(w) x 10.00(h) x 0.05(d)

Table of Contents

X-ray Powder Diffraction.- Forty Years of Quantitative Diffraction Analysis.- Quantitative Matching of Powder Diffraction Patterns.- Experimental and Calculated Standards for Quantitative Analysis by Powder Diffraction.- X-ray Diffraction Examination of the Phases in Expansive Cements.- The Single Crystal vs. The Powder Method for Identification of Crystalline Materials.- Phase Identification by X-ray Powder Diffraction Evaluation of Various Techniques.- Chemical Identification and Phase Analysis of Transplutonium Elements and Compounds via X-ray Powder Diffraction.- X-ray Diffraction Examination of Coal Combustion Products Related to Boiler Tube Fouling and Slagging.- Computer Identification Techniques for Crystalline Compounds Using the JCPDS Powder Diffraction File as a Data Reference.- Computer Searching of the JCPDS Powder Diffraction File.- A Round Robin Test to Evaluate Computer Search/Match Methods for Qualitative Powder Diffractometry.- Direct Quantitative Determination of Silica by X-ray Diffraction on PVC Membrane Filters.- Internal Standard and Dilution Analyses Applied to the Kinetics of TiB Formation.- The Effect of the K? Doublet Diffracted Peak Position on the Precision of the Lattice Constant.- Energy Dispersive X-ray Diffractometry.- A New Method for the Determination of the Texture of Materials of Cubic Structure from Incomplete Reflection Pole Figures.- X-ray Topography.- Crystal Subgrain Misorientations via X-ray Diffraction Microscopy.- Some Topographic Observations of the Effects of Dynamical Diffraction in Imperfect Metal Crystals.- Direct Display of X-ray Topographic Images.- Characterization of Strain Distribution and Annealing Response in Deformed Silicon Crystals.- Crystal Imperfections and Magnetic Domain Walls in Thick Czochralski-Grown Nickel Single Crystals.- X-ray Diffraction Stress Analysis.- Some Problems in X-ray Stress Measurements.- Stress Measurements in Thin Films Deposited on Single Crystal Substrates Through X-ray Topography Techniques.- Location of Diffractometer Profiles in X-ray Stress Analysis.- Study of the Precision of X-ray Stress Analysis.- The Effect of Temperature and Load Cycling on the Relaxation of Residual Stresses.- Stress Measurements on Cold-Worked Fastener Holds.- Diffraction Technique For Stress Measurement In Polymeric Materials.- X-ray Diffraction Studies Of Shocked Lunar Analogs.- A Method of Determining the Elastic Properties of Alloys in Selected Crystallographic Directions for X-ray Diffraction Residual Stress Measurement.- The Need for Experimentally Determined X-ray Elastic Constants.- A Modified Diffractometer for X-ray Stress Measurements.- A Dual Detector Diffractometer for Measurement of Residual Stress.- X-ray Residual Stress Measurements Using Parallel Beam Optics.- X-ray Fluorescence.- Proton-Induced X-ray Emission Analysis of Human Autopsy Tissues.- Polymer Films as Calibration Standards for X-ray Fluorescence Analysis.- Chemical Analysis of Nickel Ores by Energy Dispersive X-ray Fluorescence.- Determination of Sulfur, ASH, and Trace Element Content of Coal, Coke, and Fly ASH Using Multielement Tube-Excited X-ray Fluorescence Analysis.- Advances in the Preconcentration of Dissolved Ions in Water Samples.- Concentration of U and Np from Pu and Pu Alloys for Determination by X-ray Fluorescence.- Preconcentration of Uranium in Natural Waters for X-ray Fluorescence Analysis.- “Loss on Ignition” in Fused Glass Buttons.- Measurement of “Chemical Shift” by an Automated Commercial X-ray Fluorescence Spectrometer.- Low Energy Mass Absorption Coefficients from Proton Induced X-ray Spectroscopy.- Processing of Energy Dispersive X-ray Spectra.- Use of X-ray Scattering in Absorption Corrections for X-ray Fluorescence Analysis of Aerosol Loaded Filters.- An Interactive Program for the Control of the X-ray Spectrometer, for Data Collection and Data Manipulation — Use in Qualitative Analysis.- Lama I — a General Fortran Program for Quantitative X-ray Fluorescence Analysis.- X-ray Instrumentation.- A Novel X-ray Powder Diffractometer Detector System.- Counting Rate Performance of Pulsed-Tube Systems.- A New Method for the Elimination of the Wall Effect in Proportional Counter.- X-ray Intensities from Copper-Target Diffraction Tubes.- Polarized Radiation Produced by Scatter for Energy Dispersive X-ray Fluorescence Trace Analysis.- Author Index.

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