X-ray diffraction as a method of qualitative analysis for crystal line phases has been long accepted, and has had constant improvement in method and equipment. It has also been made more useful by the growth and improvement of the data collection available as reference standards. In recent years some attempts have been made to use the method to a greater extent by furnishing results on a quantitative basis. This has proved to be difficult because of the problem of comparing the relative intensities of the diffraction peaks from one phase to another. This year the initial session of invited papers focuses primarily on this problem. The subject is approached both by the use of internal comparison standards and by calculation of intensities. In addition, the identification of crystalline phases by X-ray diffraction of single crystals is discussed in an invited paper. This method, with its advantages of the use of very small samples, is becoming increasingly feasible because of the development of simple equipment and the avail ability of a growing data bank. Other X-ray diffraction developments discussed at the Conference include stress analysis, use of computers for searching the JCPDS powder diffraction file, texture analysis, and applications to specific fields. Spectroscopy topics covered at the conference included a discussion of methods of concentration of materials for fluorescence analysis, soft X-ray spectra, and equipment for fluorescence analysis.
|Edition description:||Softcover reprint of the original 1st ed. 1977|
|Product dimensions:||7.01(w) x 10.00(h) x 0.05(d)|
Table of ContentsX-ray Powder Diffraction.- Forty Years of Quantitative Diffraction Analysis.- Quantitative Matching of Powder Diffraction Patterns.- Experimental and Calculated Standards for Quantitative Analysis by Powder Diffraction.- X-ray Diffraction Examination of the Phases in Expansive Cements.- The Single Crystal vs. The Powder Method for Identification of Crystalline Materials.- Phase Identification by X-ray Powder Diffraction Evaluation of Various Techniques.- Chemical Identification and Phase Analysis of Transplutonium Elements and Compounds via X-ray Powder Diffraction.- X-ray Diffraction Examination of Coal Combustion Products Related to Boiler Tube Fouling and Slagging.- Computer Identification Techniques for Crystalline Compounds Using the JCPDS Powder Diffraction File as a Data Reference.- Computer Searching of the JCPDS Powder Diffraction File.- A Round Robin Test to Evaluate Computer Search/Match Methods for Qualitative Powder Diffractometry.- Direct Quantitative Determination of Silica by X-ray Diffraction on PVC Membrane Filters.- Internal Standard and Dilution Analyses Applied to the Kinetics of TiB Formation.- The Effect of the K? Doublet Diffracted Peak Position on the Precision of the Lattice Constant.- Energy Dispersive X-ray Diffractometry.- A New Method for the Determination of the Texture of Materials of Cubic Structure from Incomplete Reflection Pole Figures.- X-ray Topography.- Crystal Subgrain Misorientations via X-ray Diffraction Microscopy.- Some Topographic Observations of the Effects of Dynamical Diffraction in Imperfect Metal Crystals.- Direct Display of X-ray Topographic Images.- Characterization of Strain Distribution and Annealing Response in Deformed Silicon Crystals.- Crystal Imperfections and Magnetic Domain Walls in Thick Czochralski-Grown Nickel Single Crystals.- X-ray Diffraction Stress Analysis.- Some Problems in X-ray Stress Measurements.- Stress Measurements in Thin Films Deposited on Single Crystal Substrates Through X-ray Topography Techniques.- Location of Diffractometer Profiles in X-ray Stress Analysis.- Study of the Precision of X-ray Stress Analysis.- The Effect of Temperature and Load Cycling on the Relaxation of Residual Stresses.- Stress Measurements on Cold-Worked Fastener Holds.- Diffraction Technique For Stress Measurement In Polymeric Materials.- X-ray Diffraction Studies Of Shocked Lunar Analogs.- A Method of Determining the Elastic Properties of Alloys in Selected Crystallographic Directions for X-ray Diffraction Residual Stress Measurement.- The Need for Experimentally Determined X-ray Elastic Constants.- A Modified Diffractometer for X-ray Stress Measurements.- A Dual Detector Diffractometer for Measurement of Residual Stress.- X-ray Residual Stress Measurements Using Parallel Beam Optics.- X-ray Fluorescence.- Proton-Induced X-ray Emission Analysis of Human Autopsy Tissues.- Polymer Films as Calibration Standards for X-ray Fluorescence Analysis.- Chemical Analysis of Nickel Ores by Energy Dispersive X-ray Fluorescence.- Determination of Sulfur, ASH, and Trace Element Content of Coal, Coke, and Fly ASH Using Multielement Tube-Excited X-ray Fluorescence Analysis.- Advances in the Preconcentration of Dissolved Ions in Water Samples.- Concentration of U and Np from Pu and Pu Alloys for Determination by X-ray Fluorescence.- Preconcentration of Uranium in Natural Waters for X-ray Fluorescence Analysis.- “Loss on Ignition” in Fused Glass Buttons.- Measurement of “Chemical Shift” by an Automated Commercial X-ray Fluorescence Spectrometer.- Low Energy Mass Absorption Coefficients from Proton Induced X-ray Spectroscopy.- Processing of Energy Dispersive X-ray Spectra.- Use of X-ray Scattering in Absorption Corrections for X-ray Fluorescence Analysis of Aerosol Loaded Filters.- An Interactive Program for the Control of the X-ray Spectrometer, for Data Collection and Data Manipulation Use in Qualitative Analysis.- Lama I a General Fortran Program for Quantitative X-ray Fluorescence Analysis.- X-ray Instrumentation.- A Novel X-ray Powder Diffractometer Detector System.- Counting Rate Performance of Pulsed-Tube Systems.- A New Method for the Elimination of the Wall Effect in Proportional Counter.- X-ray Intensities from Copper-Target Diffraction Tubes.- Polarized Radiation Produced by Scatter for Energy Dispersive X-ray Fluorescence Trace Analysis.- Author Index.