Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard

Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard

Paperback(Softcover reprint of hardcover 1st ed. 1999)

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Analog and Mixed-Signal Boundary-Scan: A Guide to the IEEE 1149.4 Test Standard by Adam Osseiran

The Mixed-Signal Boundary-Scan Test Bus is the natural complement to the widely used Boundary-Scan IEEE Std. 1149.1, commonly known as JTAG. This new Mixed-Signal standard is called IEEE Standard 1149.4 and is mainly dedicated to the manufacturing test of analog and mixed-signal boards. But like the IEEE 1149.1 it can be used for many other purposes: the test buses and their digital control form a very general 'analog data highway'.
Increasingly, mixed-signal boards are gaining complexity, making their testing process extremely challenging. At the same time, IC complexity and technology are getting so sophisticated that testing ICs at the board level becomes very expensive. Embedding a part of the board tester on chip is the aim of the IEEE 1149.4.
Analog and Mixed-Signal Boundary-Scan is a comprehensive treatment of the design, application and structure of the IEEE 1149.4. It updates the information on digital Boundary-Scan and addresses chip designers in a dedicated chapter containing guidance to easily build analog circuits including IEEE 1149.4. A basic metrology and a test strategy with the instrumentation needed for it are also described.
Analog and Mixed-Signal Boundary-Scan is essential reading for researchers and professionals who need to understand IEEE Standard 1149.4 and its practical implementation in industry.

Product Details

ISBN-13: 9781441951151
Publisher: Springer US
Publication date: 12/10/2010
Series: Frontiers in Electronic Testing , #16
Edition description: Softcover reprint of hardcover 1st ed. 1999
Pages: 156
Product dimensions: 6.10(w) x 9.25(h) x 0.01(d)

About the Author

Adam Osseiran is Professor of Electrical Engineering at the Engineering Institute of Geneva, Switzerland and the European Design and Test Specialist at Fluence Technology Inc., Beaverton, Oregon, USA. He is the present Chair of the IEEE 1149.4 Working Group.

Table of Contents

List of Figures. List of Contributors. Preface. 1. Introduction to the IEEE 1149.4. 2. The Boundary-Scan Standard. 3. IEEE 1149.4 Architecture and Instruction Set. 4. System Test Methodologies Using IEEE 1149.4. 5. Peripheral Cell Design for IEEE 1149.4. 6. Structural Testing. Summary. Index.

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