Applied Measurement with jMetrik

Applied Measurement with jMetrik

by J. Patrick Meyer

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Product Details

ISBN-13: 9780415531979
Publisher: Taylor & Francis
Publication date: 06/30/2014
Pages: 149
Product dimensions: 6.00(w) x 9.00(h) x 0.60(d)

About the Author

J. Patrick Meyer is an associate professor in the Curry School of Education at the University of Virginia

Table of Contents

Preface. Acknowledgements. Chapter 1: Data Management. Chapter 2: Item Scoring. Chapter 3: Test Scaling. Chapter 4: Item Analysis. Chapter 5: Reliability. Chapter 6: Differential Item Functioning. Chapter 7: Rasch Measurement. Chapter 8: Polytomous Rasch Models. Chapter 9: Plotting Item and Test Characteristics. Chapter 10: IRT Scale Linking and Score Equating. References. Appendix

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