Pub. Date:
Springer Berlin Heidelberg
Applied Scanning Probe Methods XII: Characterization / Edition 1

Applied Scanning Probe Methods XII: Characterization / Edition 1

by Bharat Bhushan, Harald Fuchs


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Product Details

ISBN-13: 9783540850380
Publisher: Springer Berlin Heidelberg
Publication date: 12/08/2008
Series: NanoScience and Technology
Edition description: 2009
Pages: 224
Product dimensions: 6.20(w) x 9.50(h) x 0.60(d)

Table of Contents

RH. Eibl: Direct Force Measurements of Receptor-Ligand Interactions on Living Cells.- D. Alsteens, V. Dupres, E. Dague, C. Verbelen, G. Andre, G. Francius and YF Dufrêne: Imaging Chemical Groups and Molecular Recognition Sites on Live Cells Using AFM.- P.G. Gucciardi: Applications of Scanning Near-Field Optical Microscopy in Life Science.- S. Bistac and M. Schmitt: Adhesion and Friction of Polymers at Nanoscale: Investigation by AFM.- G. Bolzon, M. Bocciarelli, and E.J. Chiarullo: Mechanical Characterisation of Materials by Microindentation and AFM Scanning.- G. Rubio-Bollinger, J.J. Riquelme, S. Vieira, and N. Agrait: Mechanical Properties of Metallic Nanocontacts.- A. Maali, T. Cohen-Bouhacina, C. Hurth, C. Jai, R. Boisgard, and J-P Aimé: Dynamic AFM in Liquid: Viscous Damping and Applications to Study Confined Liquid.- U. Lang and J. Dual: Microtensile Tests Using In Situ Atomic Force Microscopy.- H. Guo, Y. Wang, and H. Gao: Scanning Tunneling Microscopy of Si(100)-7x7 Surface and Adsorbed Ge Nanostructures.

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