ISBN-10:
3642067735
ISBN-13:
9783642067730
Pub. Date:
11/09/2010
Publisher:
Springer Berlin Heidelberg
Atomic and Nuclear Analytical Methods: XRF, M�ssbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques / Edition 1

Atomic and Nuclear Analytical Methods: XRF, M�ssbauer, XPS, NAA and Ion-Beam Spectroscopic Techniques / Edition 1

by Hem Raj Verma
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Product Details

ISBN-13: 9783642067730
Publisher: Springer Berlin Heidelberg
Publication date: 11/09/2010
Edition description: Softcover reprint of hardcover 1st ed. 2007
Pages: 376
Product dimensions: 6.10(w) x 9.25(h) x 0.24(d)

Table of Contents

X-ray Fluorescence (XRF) and Particle-Induced X-ray Emission (PIXE).- Rutherford Backscattering Spectroscopy.- Elastic Recoil Detection.- Mössbauer Spectroscopy (MS).- X-Ray Photoelectron Spectroscopy.- Neutron Activation Analysis.- Nuclear Reaction Analysis and Particle-Induced Gamma-Ray Emission.- Accelerator Mass Spectrometry (AMS).

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