ISBN-10:
1420045547
ISBN-13:
9781420045543
Pub. Date:
10/24/2008
Publisher:
Taylor & Francis
Handbook of Charged Particle Optics / Edition 2

Handbook of Charged Particle Optics / Edition 2

by Jon Orloff
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Product Details

ISBN-13: 9781420045543
Publisher: Taylor & Francis
Publication date: 10/24/2008
Edition description: REV
Pages: 666
Product dimensions: 7.30(w) x 10.10(h) x 1.50(d)

Table of Contents

Review of ZrO/W Schottky Cathode
L. W. Swanson and G. A. Schwind

Liquid Metal Ion Sources
R. G. Forbes and (the late) G. L. R. Mair

Gas Field Ionization Sources
R. G. Forbes

Magnetic Lenses for Electron Microscopy
K. Tsuno

Electrostatic Lenses
B. Lencová

Aberrations
P. W. Hawkes

Space Charge and Statistical Coulomb Effects
P. Kruit and G. H. Jansen

Resolution
M. Sato

Scanning Electron Microscope
A. E. Vladár and M. T. Postek

Scanning Transmission Electron Microscope
A. V. Crewe (updated by P. D. Nellist)

Focused Ion Beams
M. Utlaut

Aberration Correction in Electron Microscopy
O. L. Krivanek, N. Dellby and M. F. Murffitt

Appendix: Computational Resources for Electron Microscopy
J. Orloff (with valuable information from P. W. Hawkes and B. Lencová)

Index

What People are Saying About This

From the Publisher

… In giving [a] combination of practical and theoretical aspects, the book is a valuable reference when it comes to the design of charged particle optical elements in microscopy such as scanning electron microscopes or scanning transmission electron microscopes. … The index is very comprehensive and helps in making the book a valuable reference. Although the text comes from 18 different authors each with their individual style, it is nevertheless well written and clear throughout. The eight unnumbered colour pages at the centre of the book are also a nice feature. Altogether, the book is valuable for experts and those who want to become experts concerned with the design and understanding of charged particle optics as used in electron microscopy. Owing to the rigorous mathematical treatment of particle optical effects, it will also help in the analysis of observed effects such as aberrations and their correction, space charge effects, as well as issues concerning the resolution obtained in microscopy.
—Manuel Vogel, Contemporary Physics, Vol. 51, Issue 4, July 2010

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