Electromigration in Thin Films and Electronic Devices: Materials and Reliability

Electromigration in Thin Films and Electronic Devices: Materials and Reliability

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Product Details

ISBN-13: 9780081016961
Publisher: Elsevier Science
Publication date: 09/02/2016
Pages: 352
Product dimensions: 6.14(w) x 9.21(h) x 0.74(d)

About the Author

Choong-Un Kim is Professor of Materials Science and Engineering at the University of Texas at Arlington, USA.

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