Pub. Date:
Taylor & Francis
Electron Microscopy And Analysis 2003 / Edition 1

Electron Microscopy And Analysis 2003 / Edition 1

by S McVitie, D McComb


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Electron microscopy is now a mainstay characterization tool for solid state physicists and chemists as well as materials scientists. Containing the proceedings from the Electron Microscopy and Analysis Group (EMAG) conference in September 2003, this volume covers current developments in the field, primarily in the UK. These conferences are biennial events organized by the EMAG of the Institute of Physics to provide a forum for discussion of the latest developments in instrumentation, techniques, and applications of electron and scanning probe microscopies.

Product Details

ISBN-13: 9780750309677
Publisher: Taylor & Francis
Publication date: 02/19/2004
Series: Institute of Physics Conference Series , #179
Pages: 279
Product dimensions: 6.25(w) x 9.25(h) x 1.25(d)

About the Author

Stephen McVitie, David McComb

Table of Contents

Plenary Lectures
Functional Materials and Biomaterials
New Instrumentation
Imaging Theory
Theory of Microscopy and Spectroscopy
Structural Materials
Advances in Nanoanalysis
Advances in Imaging
Sample Preparation and Nanofabrication
Surfaces and Interfaces

Author Index
Subject Index

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