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Exploring Scanning Probe Microscopy with MATHEMATICA / Edition 2

Exploring Scanning Probe Microscopy with MATHEMATICA / Edition 2

by Dror Sarid


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Product Details

ISBN-13: 9783527406173
Publisher: Wiley
Publication date: 03/05/2007
Edition description: 2nd, Revised and Enlarged Edition
Pages: 310
Product dimensions: 7.00(w) x 9.70(h) x 0.82(d)

About the Author

Dror Sarid is Professor and Director of the Optical Data Storage Center at the Optical Sciences Center, the University of Arizona in Tucson. His interests have been in the fields of light scattering phenomena and guided wave physics, and in the past 20 years he has been studying Scanning Tunneling Microscopy, Atomic Force Microscopy and related fields. Dr. Sarid is the author of 'Scanning Force Microscopy with Applications to Electric, Magnetic and Atomic Forces' (OUP) and 'Exploring Scanning Probe Microscopy with Mathematica' (Wiley) as well as of more than 150 publications and seven patents.

Table of Contents

1 Introduction
2 Uniform Cantilevers
3 Cantilever Conversion Tables
4 V-Shaped Cantilevers
5 Tip Sample Adhesion
6 Tip Sample Force Curve
7 Free Vibrations
8 Noncontact Mode
9 Tapping Mode
10 Metal-Insulator-Metal Tunneling
11 Fowler-Nordheim Tunneling
12 Scanning Tunneling Spectroscopy
13 Coulomb Blockade
14 Density of States
15 Electrostatics
16 Near-Field Optics
17 Constriction and Boundary Resistence
18 Scanning Thermal Conductivity Microscopy
19 Kelvin Probe Force Microscopy
20 Raman Scattering in Nanocrystals

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