Exploring Scanning Probe Microscopy with MATHEMATICA / Edition 2 available in Hardcover
- Pub. Date:
This new and completely updated edition features not only an accompanying CD-ROM, but also a new applications section, reflecting the many breakthroughs in the field over the last few years. It provides a complete set of computational models that describe the physical phenomena associated with scanning tunneling microscopy, atomic force microscopy, and related technologies.
The result is both a solid professional reference and an advanced-level text, beginning with the basics and moving on to the latest techniques, experiments, and theory. In the section devoted to atomic force microscopy, the author describes the mechanical properties of cantilevers, atomic force microscope tip-sample interactions, and cantilever vibration characteristics. This is followed by an in-depth treatment of theoretical and practical aspects of tunneling phenomena, including metal-insulator-metal tunneling and Fowler-Nordheim field emission. The final section features applications, dealing with, among others, Kelvin and Raman probe microscopy.
The self-contained presentation spares researchers valuable time spent hunting through the technical literature for the theoretical results required to understand the models presented. The Mathematica code for all the examples is included in the CD-ROM, affording the freedom to change the values and parameters of specific problems as desired, or even modify the programs themselves to suit various modeling needs.
|Edition description:||2nd, Revised and Enlarged Edition|
|Product dimensions:||7.00(w) x 9.70(h) x 0.82(d)|
About the Author
Dror Sarid is Professor and Director of the Optical Data Storage Center at the Optical Sciences Center, the University of Arizona in Tucson. His interests have been in the fields of light scattering phenomena and guided wave physics, and in the past 20 years he has been studying Scanning Tunneling Microscopy, Atomic Force Microscopy and related fields. Dr. Sarid is the author of 'Scanning Force Microscopy with Applications to Electric, Magnetic and Atomic Forces' (OUP) and 'Exploring Scanning Probe Microscopy with Mathematica' (Wiley) as well as of more than 150 publications and seven patents.
Table of Contents
2 Uniform Cantilevers
3 Cantilever Conversion Tables
4 V-Shaped Cantilevers
5 Tip Sample Adhesion
6 Tip Sample Force Curve
7 Free Vibrations
8 Noncontact Mode
9 Tapping Mode
10 Metal-Insulator-Metal Tunneling
11 Fowler-Nordheim Tunneling
12 Scanning Tunneling Spectroscopy
13 Coulomb Blockade
14 Density of States
16 Near-Field Optics
17 Constriction and Boundary Resistence
18 Scanning Thermal Conductivity Microscopy
19 Kelvin Probe Force Microscopy
20 Raman Scattering in Nanocrystals