High-Resolution Electron Microscopy

High-Resolution Electron Microscopy

by John C. H. Spence


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Spence (physics and astronomy, Arizona State U.) updates the 1988 edition of this overview of the field with current developments in nearly every section, including three new chapters on STEM, super-resolution methods and image processing, and on HREM in biology, new sections are added throughout, and the entire book has undergone a thorough revision. High quality b&w plates, with a few in color. Annotation ©2003 Book News, Inc., Portland, OR

Product Details

ISBN-13: 9780198795834
Publisher: Oxford University Press
Publication date: 06/13/2017
Edition description: Reprint
Pages: 432
Product dimensions: 6.70(w) x 9.60(h) x 1.00(d)

About the Author

John C. H. Spence, Regents' Professor of Physics, Arizona State University

John C. H. Spence is Regents' Professor of Physics at Arizona State University with a joint appointment at Lawrence Berkeley Laboratory. He completed a PhD in Physics at Melbourne University in Australia, followed by postdoctoral work in Materials Science at Oxford University, UK. He is a Fellow of the American Physical Society, of the Institute of Physics, of the American Association for the Advancement of Science, and of Churchill College Cambridge, UK. He is a recent co-editor of Acta Crystallographica and served on the editorial board of Reports on Progress in Physics. He has served on the Scientific Advisory Committee of the Molecular Foundry and the Advanced Light Source at the Lawrence Berkeley Laboratory and the DOE's BESAC committee. He has been awarded the Burton Medal and the Distinguished Scientist Award of the Microscopy Society of America, and the Buerger Medal of the American Crystallographic Association.

Table of Contents

1. Preliminaries
2. Electron Optics
3. Wave Optics
4. Coherence and Fourier Optics
5. Imaging Thin Crystals and their Defects
6. Imaging Molecules: Radiation Damage
7. Image Processing, Super-Resolution, Diffractive Imaging
8. STEM and Z-contrast
9. Electron Sources and Detectors
10. Measurement of Electron-Optical Parameters
11. Instabilities and the Microscope Environment
12. Experimental Methods
13. Associated Techniques and Software Resources

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