Industrial X-Ray Computed Tomography

Industrial X-Ray Computed Tomography

Hardcover(1st ed. 2018)

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Product Details

ISBN-13: 9783319595719
Publisher: Springer International Publishing
Publication date: 10/20/2017
Edition description: 1st ed. 2018
Pages: 369
Product dimensions: 6.10(w) x 9.25(h) x (d)

About the Author

Simone Carmignato is Professor of Manufacturing Engineering and Manufacturing Metrology at the University of Padua, Italy. His research activities are in the area of precision engineering and dimensional metrology, with focus on industrial computed tomography and advanced coordinate metrology. In 2012, he was awarded the F. W. Taylor Medal from CIRP, the International Academy for Production Engineering.

Wim Dewulf holds a Professorship in the Department of Mechanical Engineering at KU Leuven, Belgium, where he is leading research groups on Sustainable Engineering and on Dimensional Metrology. In the latter field, his major research themes include X-ray computed tomography, multi-sensor metrology, and automated inspection planning. He was, amongst others, coordinating the highly successful INTERAQCT project, which provided an extensive industrial-academic training environment for young researchers in the field of X-ray CT metrology.

Richard Leach is Chair in Metrology at The University of Nottingham, UK, and heads up the Manufacturing Metrology Team. Richard’s current interests are the dimensional measurement of precision and additive manufactured structures. His research themes include the measurement of surface topography, development of methods for measuring 3D structures, development of methods for controlling large surfaces to high resolution in industrial applications and x-ray computed tomography.

Table of Contents

Introduction.- Principles of X-ray computed tomography.- Technical concepts and components.- Processing and visualization of CT data.- Computer simulation.- Error sources.- Performance verification.- Traceability of CT dimensional measurements.- CT for non-destructive testing and materials characterization.- CT for dimensional metrology.- Other industrial applications.

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