Nanoscale Characterization of Surfaces and Interfaces

Nanoscale Characterization of Surfaces and Interfaces

by N. John DiNardo

Hardcover

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Product Details

ISBN-13: 9783527292479
Publisher: Wiley
Publication date: 10/28/1999
Pages: 173
Product dimensions: 6.87(w) x 9.80(h) x 0.59(d)

Table of Contents

Introduction
Scanning Tunneling Microscopy (STM)
Atomic Force Microscopy/
Manipulation of Atoms and Atom Clusters on the Nanoscale
Spin.Offs of STM -
Non-Contact Nanoscale Probes
Acknowledgements
References

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