ISBN-10:
3642073506
ISBN-13:
9783642073502
Pub. Date:
12/07/2010
Publisher:
Springer Berlin Heidelberg
Nondestructive Materials Characterization: With Applications to Aerospace Materials / Edition 1

Nondestructive Materials Characterization: With Applications to Aerospace Materials / Edition 1

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Overview

Nondestructive Materials Characterization: With Applications to Aerospace Materials / Edition 1

With an emphasis on aircraft materials, this book describes techniques for the material characterization to detect and quantify degradation processes such as corrosion and fatigue. It introduces readers to these techniques based on x-ray, ultrasonic, optical and thermal principles and demonstrates the potential of the techniques for a wide variety of applications concerning aircraft materials, especially aluminum and titanium alloys. The advantages and disadvantages of various techniques are evaluated.

Product Details

ISBN-13: 9783642073502
Publisher: Springer Berlin Heidelberg
Publication date: 12/07/2010
Series: Springer Series in Materials Science , #67
Edition description: Softcover reprint of hardcover 1st ed. 2004
Pages: 418
Product dimensions: 6.10(w) x 9.25(h) x 0.24(d)

Table of Contents

1 Degradation of Aircraft Structures.- 2 Optical Detection of Surface Damage.- 3 Microradiographic and Foil Penetration Methods for Quantification of Localized Corrosion.- 4 Interferometric and Holographic Imaging of Surface Wave Patterns for Characterization of Material Degradation.- 5 Surface Acoustic Wave Characterization of Pitting Corrosion Damage with Fatigue Crack.- 6 Ultrasonic Fatigue Crack Detection in Aluminum and Titanium Alloys.- 7 Early Detection of Fatigue Damage in Ti-6A1-4V with Nonlinear Acoustics.- 8 Ultrasonic Absorption Measurements.- 9 Thermographic Materials Characterization.- 10 Scanning Vibrating Electrode Technique as a Benchmark for NDE of Corrosion.- 11 Acoustic Imaging Techniques for Characterization of Corrosion, Corrosion Protective Coatings, and Surface Cracks.- 12 Scanning Probe Microscopy: Ultrasonic Force and Scanning Kelvin Probe Force Microscopy.- 13 High Resolution Microellipsometry.- 14 Positron Annihilation Spectroscopy (PAS).

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