Nyquist AD Converters, Sensor Interfaces, and Robustness: Advances in Analog Circuit Design, 2012

Nyquist AD Converters, Sensor Interfaces, and Robustness: Advances in Analog Circuit Design, 2012

Paperback(2013)

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Overview

Written by experts in industry and academia, this collection of tutorials, originally presented to the 21st workshop on Advances in Analog Circuit Design, covers Nyquist A/D converters, capacitive sensor interfaces, reliability, variability, and connectivity.

Product Details

ISBN-13: 9781489997944
Publisher: Springer New York
Publication date: 12/13/2014
Edition description: 2013
Pages: 294
Product dimensions: 6.10(w) x 9.25(h) x 0.03(d)

Table of Contents

Part I: Nyquist A/D Converters.- High Performance Pipelined A/D Converters in CMOS and BiCMOS Processes.- Dual Residue Pipeline ADC.- Time-Interleaved SAR and Slope Converters.- GS/s AD Conversion for Broadband Multi-Stream Reception.- CMOS Ultra High-Speed Time-Interleaved ADCs.- CMOS ADCs for Optical Communications.- Part II: Capacitive Sensor Interfaces.-MEMS and Sensors, Today and Tomorrow.- Energy-Efficient Capacitive Sensor Interfaces.- Interface Circuitsfor MEMS Microphones.- Front-End Electronics for Solid State Detectors inPresent and Future High-Energy Physics Experiments.- Part III:Robustness.- How Can Chips Live Under Radiation?.- TDC and Rad Environments.- Matching and Resolution.- Matching in Polymer and Effect on Circuit Topologies.- Statistical Variability and Reliability in Nano-CMOS Transistors.

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