Paperback(Softcover reprint of hardcover 1st ed. 1998)

$138.25 $149.00 Save 7% Current price is $138.25, Original price is $149. You Save 7%.
Eligible for FREE SHIPPING
  • Get it by Wednesday, September 27 , Order now and choose Expedited Delivery during checkout.

Overview

On-Line Testing for VLSI by Michael Nicolaidis

Test functions (fault detection, diagnosis, error correction, repair, etc.) that are applied concurrently while the system continues its intended function are defined as on-line testing. In its expanded scope, on-line testing includes the design of concurrent error checking subsystems that can be themselves self-checking, fail-safe systems that continue to function correctly even after an error occurs, reliability monitoring, and self-test and fault-tolerant designs.
On-Line Testing for VLSI contains a selected set of articles that discuss many of the modern aspects of on-line testing as faced today. The contributions are largely derived from recent IEEE International On-Line Testing Workshops. Guest editors Michael Nicolaidis, Yervant Zorian and Dhiraj Pradhan organized the articles into six chapters. In the first chapter the editors introduce a large number of approaches with an expanded bibliography in which some references date back to the sixties.
On-Line Testing for VLSI is an edited volume of original research comprising invited contributions by leading researchers.

Product Details

ISBN-13: 9781441950338
Publisher: Springer US
Publication date: 12/06/2010
Series: Frontiers in Electronic Testing Series , #11
Edition description: Softcover reprint of hardcover 1st ed. 1998
Pages: 160
Product dimensions: 7.01(w) x 10.00(h) x 0.01(d)

Customer Reviews

Most Helpful Customer Reviews

See All Customer Reviews