PIXE: A Novel Technique for Elemental Analysis

PIXE: A Novel Technique for Elemental Analysis

by Sven A. E. Johansson, John L. Campbell


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Product Details

ISBN-13: 9780471920113
Publisher: Wiley
Publication date: 11/09/1988
Pages: 360
Product dimensions: 1.42(w) x 2.17(h) x (d)

Table of Contents

Atomic Inner-Shell X-Ray Spectra and X-Ray Spectrometers.

Characteristic and Continuous X-Ray Spectra Induced by MeV Ion Beams.

Beam-Handling and Specimen Chamber Design for PIXE in Vacuum.

Thin Specimens: Preparation, Basic Formalism and Detection Limits.

Analysis of Specimens of Intermediate Thickness.

Analysis of Thick Specimens.

Non-Vacuum PIXE.

Further Aspects of Si(Li) Spectroscopy in the Context of PIXE.

Analytic Fitting of PIXE Spectra.

Further Aspects of Thick Specimen Analysis.

Biological and Medical Applications.

Atmospheric Applications.

Applications in Geoscience.

Applications in Art and Archaeology.

Miscellaneous Applications.


Comparison with Other Methods.

Future Prospects.

Appendix: Numerical Data.


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