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The first comprehensive review of the basic physics, and modern applications, of proton-induced x-ray emission. The physics section and the applications section are relatively independent, making for easy reference. The authors discuss instrument design, and how to handle specimens. They then survey the wide range of applications to which proton-induced x-ray emission has been put. Illustrated.
|Product dimensions:||1.42(w) x 2.17(h) x (d)|
Table of Contents
Atomic Inner-Shell X-Ray Spectra and X-Ray Spectrometers.
Characteristic and Continuous X-Ray Spectra Induced by MeV Ion Beams.
Beam-Handling and Specimen Chamber Design for PIXE in Vacuum.
Thin Specimens: Preparation, Basic Formalism and Detection Limits.
Analysis of Specimens of Intermediate Thickness.
Analysis of Thick Specimens.
Further Aspects of Si(Li) Spectroscopy in the Context of PIXE.
Analytic Fitting of PIXE Spectra.
Further Aspects of Thick Specimen Analysis.
Biological and Medical Applications.
Applications in Geoscience.
Applications in Art and Archaeology.
Comparison with Other Methods.
Appendix: Numerical Data.