Reliability Investigation of LED Devices for Public Light Applications focuses on state-of-the-art GaN-based LED technology through the study of typical failure mechanisms in public lighting applications.
Across the different chapters, the reader will explore the tools and analyses involved in the study and application of a number of different LED devices. The authors review GaN-based LED technology by focusing on the main failure mechanisms targeting polymer-based packaging, thanks to electrical and spectral models.
The proposed technology and methodologies will help those interested in the topic to further their knowledge of failure mechanisms, exploring the physical and chemical analyses involved.
- Based on the work of two main Phd results in 2011 and 2014
- Describes GaN technology in the state-of-the-art, focusing on the specific electrical and spectral model
- Proposes the technology and methodologies to understand failure mechanisms
|Product dimensions:||6.50(w) x 1.50(h) x 9.50(d)|
About the Author
Raphael Baillot is R&D and innovation director of Sunna Design SA. He leads the overall R&D and innovation roadmap of Sunna Design focused on the development of LED-based solar street lights to bring sustainable solutions to the global market of rural electrification.Yannick Deshayes is Associate Professor at the University of Bordeaux, France. His research focuses on the physics of failure, from photonics materials to complex devices.
Table of Contents
1. Light-emitting Diodes: State-of-the-Art GaN Technologies 2. Tools and Analysis Methods of Encapsulated LEDs 3. Failure Analysis Methodology of Blue LEDs 4. Integration of the Methodology Starting from Component Design