Reliability Prediction from Burn-In Data Fit to Reliability Models

Reliability Prediction from Burn-In Data Fit to Reliability Models

by Joseph Bernstein

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Product Details

ISBN-13: 9780128007471
Publisher: Elsevier Science
Publication date: 04/15/2014
Pages: 108
Product dimensions: 5.90(w) x 8.80(h) x 0.40(d)

About the Author

Joseph B. Bernstein is Professor of Electrical Engineering at Ariel University, Ariel, Israel. He received his PhD from MIT, Cambridge, MA, USA, and has previously worked as a Professor at Bar Ilan University, Israel, and at the University of Maryland and the MIT Lincoln Laboratory. He has co-authored two books.

Table of Contents

Introduction
1. Shortcut to accurate reliability prediction
2. M-HTOL Principles
3. Failure Mechanisms
4. New M-HTOL Approach
5. Bibliography

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