Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale

Scanning Probe Microscopy: Electrical and Electromechanical Phenomena at the Nanoscale

by Sergei V. Kalinin, Alexei Gruverman


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Product Details

ISBN-13: 9780387286679
Publisher: Springer New York
Publication date: 12/18/2006
Edition description: 2007
Pages: 980
Product dimensions: 6.10(w) x 9.25(h) x 0.05(d)

Table of Contents

SPM Techniques for electrical characterization. -Scanning Tunneling Microscopy and Tunneling Potentiometry. -Scanning Spreading Resistance Microscopy and Scanning Potentiometry. -Scanning Capacitance Microscopy and Nanoimpedance Microscopy. -Scanning Gate Microscopy. -Force-based SPM transport measurements: KPFM, EFM and SIM. -Piezoresponse Force Microscopy. -Ultrasonic Force Microscopy. -Microwave Microscopy. -Near Field Optical Microscopy. -Electrochemical STM. -Advanced SPM Probes for Electrical Characterization. -Electrical and electromechanical imaging at the limits of resolution. -Surface Metal Insulator Transitions. -Spin polarized STM. -STM probing of molecular transport. -Kelvin Probe Force Microscopy of atomic systems. -Single-electron transport in 1D systems. -Theoretical aspects of electrical transport imaging in molecular systems. -Friction on the atomic scale. -Mechanics on the molecular scale. -Electrical SPM characterization of materials and devices. -SPM transport in semiconductors. -SCM and KPFM of semiconductor heterostructures. -SPM characterization of Ferroelectric Materials. -SCM of operational devices. -Photoinduced phenomena in semiconductor heterostructures. -SPM characterization of III-nitrides materials. -Advanced semiconductor metrology by SPM. -Transport in organic electronics. -Electrical nanofabrication. -Direct Nanooxidation. -Ferroelectric Lithography. -Resist-based SPM oxidation techniques. -Charge deposition lithography. -Electrochemical surafecSurface Modification.

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