Secondary Ion Mass Spectrometry: Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS Six), Palais des Congre Versailles, France, September 13-18th, 1987

Secondary Ion Mass Spectrometry: Proceedings of the Sixth International Conference on Secondary Ion Mass Spectrometry (SIMS Six), Palais des Congre Versailles, France, September 13-18th, 1987

Hardcover

$211.00

Product Details

ISBN-13: 9780471918325
Publisher: Wiley, John & Sons, Incorporated
Publication date: 07/01/1988
Pages: 1106
Product dimensions: 1.38(w) x 2.17(h) x (d)

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