ISBN-10:
073540058X
ISBN-13:
9780735400580
Pub. Date:
05/28/2002
Publisher:
American Institute of Physics
Stress Induced Phenomena in Metallization: Sixth International Workshop on Stress Induced Phenomena in Metallilzation / Edition 1

Stress Induced Phenomena in Metallization: Sixth International Workshop on Stress Induced Phenomena in Metallilzation / Edition 1

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Overview

Stress Induced Phenomena in Metallization: Sixth International Workshop on Stress Induced Phenomena in Metallilzation / Edition 1

Tiny metal structures, less than a millionth of a meter across, are critical building blocks in a number of high-tech devices such as computer chips. These "metallizations" are subjected to extreme conditions of temperature, electric current density, and mechanical load, which may cause the device they are in to fail. This book contains research papers on these metallizations and on the reliability problems associated with them. The papers were peer reviewed for these proceedings.

Product Details

ISBN-13: 9780735400580
Publisher: American Institute of Physics
Publication date: 05/28/2002
Series: AIP Conference Proceedings / AIP Conference Proceedings Stress-Induced Phenomena Metallizat. Series , #612
Edition description: 2002
Pages: 260
Product dimensions: 9.21(w) x 6.14(h) x 0.63(d)

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