The 10th International Conference on X-Ray Microscopy

The 10th International Conference on X-Ray Microscopy


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The 10th International Conference on X-Ray Microscopy by Ian McNulty

This conference proceedings would be of interest to researchers and students in universities, national laboratories, synchrotron and x-ray laser facilities, and industries in the technical fields. Fields of interest include high-resolution x-ray microscopy and imaging, magnetism and magnetic materials, biological and biomedical sciences, and materials and condensed matter sciences.
The 10th International Conference on X-ray Microscopy (XRM 2010) was held on August 15-20, 2010 in Chicago, Illinois, USA. The latest advances in x-ray microscopy instrumentation and methods and their applications to biology, environmental, magnetism, and materials science were presented at XRM 2010.

Product Details

ISBN-13: 9780735409255
Publisher: American Institute of Physics
Publication date: 10/31/2011
Series: AIP Conference Proceedings / Accelerators, Beams, and Instrumentations Series , #1365
Edition description: 2011
Pages: 486
Product dimensions: 8.40(w) x 10.90(h) x 1.00(d)

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