Topics covered include sources, in-situ experiments, electron diffraction, Digital Micrograph, waves and holography, focal-series reconstruction and direct methods, STEM and tomography, energy-filtered TEM (EFTEM) imaging, and spectrum imaging. The range and depth of material makes this companion volume essential reading for the budding microscopist and a key reference for practicing researchers using these and related techniques.
|Publisher:||Springer International Publishing|
|Edition description:||1st ed. 2016|
|Product dimensions:||8.27(w) x 10.98(h) x (d)|
About the Author
David B. Williams is the Monte Ahuja Endowed Dean’s Chair, Executive Dean of The Professional Colleges and Dean of the College of Engineering at The Ohio State University.