X-Ray Line Profile Analysis in Materials Science

X-Ray Line Profile Analysis in Materials Science

by Jen? Gubicza

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Overview

X-Ray Line Profile Analysis in Materials Science by Jen? Gubicza

X-ray line profile analysis is an effective and non-destructive method for the characterization of the microstructure in crystalline materials. Supporting research in the area of x-ray line profile analysis is necessary in promoting further developments in this field. X-Ray Line Profile Analysis in Materials Science aims to synthesize the existing knowledge of the theory, methodology, and applications of x-ray line profile analysis in real-world settings. This publication presents both the theoretical background and practical implementation of x-ray line profile analysis and serves as a reference source for engineers in various disciplines as well as scholars and upper-level students.

Product Details

ISBN-13: 9781466658523
Publisher: IGI Global
Publication date: 01/14/2014
Pages: 360
Product dimensions: 7.00(w) x 10.00(h) x 0.81(d)

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