X-Ray Scattering from Thin Films: High Resolution X-Ray Scattering from Crystalline Thin Films

X-Ray Scattering from Thin Films: High Resolution X-Ray Scattering from Crystalline Thin Films

Hardcover

$159.95

Product Details

ISBN-13: 9783540620297
Publisher: Springer-Verlag New York, LLC
Publication date: 01/01/1999
Series: Tracts in Modern Physics Ser.
Pages: 267
Product dimensions: 6.69(w) x 9.84(h) x (d)

Table of Contents

1: Basic Elements of the Equipment
2: Diffractometers and Reflectometers
3: Scans and Resolution in Angular and Reciprocal Space
References: Part I
4: Basic Principles
5: Kinematical Scattering Theory
6: Dynamical Scattering Theory
References: Part II
7: Layer Thicknesses of Single Layers and Multilayers
8: Lattice Parameters and Lattice Strains in Single Epitaxial Layers
9: Volume Defects in Layers
10: X-Ray Reflection by Rough Multilayers
11: X-Ray Scattering by Gratings and Dots
References: Part III
A: Wave Vectors and Amplitudes of the Internal Wavefields in a Dynamically Scattering Crystal
Index

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