ISBN-10:
0792395514
ISBN-13:
9780792395515
Pub. Date:
02/28/1995
Publisher:
Springer US
Yield and Variability Optimization of Integrated Circuits / Edition 1

Yield and Variability Optimization of Integrated Circuits / Edition 1

by Jian Cheng Zhang, M.A. Styblinski

Hardcover

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Product Details

ISBN-13: 9780792395515
Publisher: Springer US
Publication date: 02/28/1995
Edition description: 1995
Pages: 234
Product dimensions: 6.10(w) x 9.25(h) x 0.02(d)

Table of Contents

List of Figures. Preface. 1. Introduction. 2. Overview of IC Statistical Modeling. 3. Design of Experiments. 4. Parametric Yield Maximization. 5. Variability Minimization and Tuning. 6. Worst-Case Measure Reduction. 7. Multi-Objective Circuit Optimization. A: Commonly Used Orthogonal Arrays. B: SPICE3 Input Decks. References. Index.

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