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Title: From Contamination to Defects, Faults and Yield Loss: Simulation and Applications, Author: Jitendra B. Khare
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From Contamination to Defects,…
by Jitendra B. Khare, Wojciech Maly
#5 in Series
Hardcover $109.99
Title: Hierarchical Modeling for VLSI Circuit Testing, Author: Debashis Bhattacharya
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Hierarchical Modeling for VLSI…
by Debashis Bhattacharya, John P. Hayes
#89 in Series
Hardcover $109.99
Title: Switch-Level Timing Simulation of MOS VLSI Circuits, Author: Vasant B. Rao
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Switch-Level Timing Simulation…
by Vasant B. Rao, David V. Overhauser, Timothy N. Trick, Ibrahim N. Hajj
#66 in Series
Hardcover $109.99
Title: High-Speed VLSI Interconnections, Author: Ashok K. Goel
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High-Speed VLSI…
by Ashok K. Goel
#185 in Series
Hardcover $214.95
Title: Mosfet Modeling For Vlsi Simulation: Theory And Practice, Author: Narain Arora
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Mosfet Modeling For Vlsi…
by Narain Arora (Editor)
Explore Series
Hardcover $228.00