Title: Reference Guide To Useful Electronic Circuits And Circuit Design Techniques - Part 1, Author: Kerwin Mathew
Title: Recurrent Neural Networks: From Simple to Gated Architectures, Author: Fathi M. Salem
Title: Recurrent Neural Networks: From Simple to Gated Architectures, Author: Fathi M. Salem
Title: Recurrent Neural Networks: From Simple to Gated Architectures, Author: Fathi M. Salem
Title: Reconfigurable Switched-Capacitor Power Converters: Principles and Designs for Self-Powered Microsystems, Author: Dongsheng Ma
Title: Reconfigurable Switched-Capacitor Power Converters: Principles and Designs for Self-Powered Microsystems, Author: Dongsheng Ma
Title: Reconfigurable Switched-Capacitor Power Converters: Principles and Designs for Self-Powered Microsystems, Author: Dongsheng Ma
Title: Reconfigurable Obfuscation Techniques for the IC Supply Chain: Using FPGA-Like Schemes for Protection of Intellectual Property, Author: Zain Ul Abideen
Title: Reconfigurable Networks-on-Chip, Author: Sao-Jie Chen
Title: Reconfigurable Field Programmable Gate Arrays for Mission-Critical Applications, Author: Niccolï Battezzati
Title: Reconfigurable Computing: From FPGAs to Hardware/Software Codesign, Author: Joao Cardoso
Title: Reconfigurable Computing: From FPGAs to Hardware/Software Codesign, Author: Joao Cardoso
Title: Reconfigurable Computing: From FPGAs to Hardware/Software Codesign, Author: Joao Cardoso
Title: Reconfigurable Computing: Accelerating Computation with Field-Programmable Gate Arrays, Author: Maya B. Gokhale
Title: Recent Findings in Boolean Techniques: Selected Papers from the 14th International Workshop on Boolean Problems, Author: Rolf Drechsler
Title: Recent Findings in Boolean Techniques: Selected Papers from the 14th International Workshop on Boolean Problems, Author: Rolf Drechsler
Title: Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact, Author: Souvik Mahapatra
Title: Recent Advances in PMOS Negative Bias Temperature Instability: Characterization and Modeling of Device Architecture, Material and Process Impact, Author: Souvik Mahapatra
Title: Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU project iRel40, Author: Willem Dirk van Driel
Title: Recent Advances in Microelectronics Reliability: Contributions from the European ECSEL JU project iRel40, Author: Willem Dirk van Driel

Pagination Links