Title: Quantitative Microbeam Analysis / Edition 1, Author: A.G Fitzgerald
Title: Electron Crystallography: Novel Approaches for Structure Determination of Nanosized Materials / Edition 1, Author: Thomas E. Weirich
Title: Advances in Imaging and Electron Physics, Author: Peter W. Hawkes
Title: High-Resolution Transmission Electron Microscopy: and Associated Techniques, Author: Peter Buseck
Title: Electron Tomography: Methods for Three-Dimensional Visualization of Structures in the Cell / Edition 2, Author: Joachim Frank
Title: Diagnostic Ultrastructural Pathology, Volume II: A Text-Atlas of Case Studies Emphasizing Respiratory and Nervous Systems / Edition 1, Author: Ann M. Dvorak
Title: The Measurement of Grain Boundary Geometry / Edition 1, Author: Valerie Randle
Title: Impact of Electron and Scanning Probe Microscopy on Materials Research / Edition 1, Author: David G. Rickerby
Title: Ultrastructure of the Ovary / Edition 1, Author: G. Familiari
Title: Scanning Microscopy for Nanotechnology: Techniques and Applications / Edition 1, Author: Weilie Zhou
Title: Progress in Transmission Electron Microscopy 2: Applications in Materials Science / Edition 1, Author: Xiao-Feng Zhang
Title: ULSI Semiconductor Technology Atlas / Edition 1, Author: Chih-Hang Tung
Title: Microscopy of Semiconducting Materials 1987, Proceedings of the Institute of Physics Conference, Oxford University, April 1987 / Edition 1, Author: A.G. Cullis
Title: Microstructural Principles of Food Processing and Engineering / Edition 2, Author: José Miguel Aguilera
Title: Biological Electron Microscopy: Theory, Techniques, and Troubleshooting / Edition 2, Author: Michael J. Dykstra
Title: Characterization of High Tc Materials and Devices by Electron Microscopy, Author: Nigel D. Browning
Title: Scanning Electron Microscopy, X-Ray Microanalysis, and Analytical Electron Microscopy: A Laboratory Workbook / Edition 1, Author: Charles E. Lyman
Title: High-Resolution Imaging and Spectrometry of Materials / Edition 1, Author: Frank Ernst
Title: Microcantilevers for Atomic Force Microscope Data Storage / Edition 1, Author: Benjamin W. Chui
Title: Reflection Electron Microscopy and Spectroscopy for Surface Analysis, Author: Zhong Lin Wang

Pagination Links